Klar uses a patented method to maintain focus on irregular surfaces. As the samples are scanned, an in-focus, two dimensional spectral map of the surface is obtained.
Typical scans contain 250K-10M spectra, each covering the visible-near IR. False color maps of the peak intensity and the wavelength (or energy) at each sample site are displayed using Klar’s analysis software. The process can capture energy shifts (due to defects, for example) as small as 0.5%.