SCANNING STUDIES AND DISCOVERIES
Gallium oxide defects
Dynamical processes in agriculture
Dislocations in InP wafers
Phase changes in 2D materials
Geology and gemology
Defect-induced LED nonuniformity
Zn variation in CdZnTe
Contact-induced stress in LEDs
C. Remple, J. Huso, and M.D. McCluskey, Photoluminescence and Raman mapping of beta-Ga2O3, AIP Advances 11, 105006 (2021).