GaN thin film
PL

349 nm kit, 90 ms integration time.

The spectrum shows features corresponding to the wurtzite and cubic phases, allowing optical examination regarding phase purity of the grown material.

Sample courtesy of Brelon May, Idaho National Laboratory

A graph showing the intensity counts versus energy in electron volts (eV), with peaks labeled 'Cubic' and 'Wurtzite' indicating specific crystal structures with a dominant peak around 3.2 eV.