Point and Shoot

Click on a graph to learn what it means and how it was made

Graph showing Raman spectroscopy data with peaks labeled for GaN and SiC, and an inset detail view highlighting specific peaks and second-order signals.
A graph showing the intensity counts versus energy in electron volts, with peaks labeled 'Wurtzite,' 'Cubic,' and 'Wurtzite' again, indicating X-ray diffraction patterns of a crystalline material.
Graph showing intensity counts versus energy in eV with four different spectra labeled Edge, Bulk, Seed, and an unlabeled spectrum, each with a peak near 1.55 eV.
Spectroscopy graph comparing intensity counts across wavelengths for defect and typical samples, with defect shown in black and typical in red.
Graph of emission intensities with peaks at 349 nm and 405 nm, and a large peak at 349 nm, showing spectral data with y-axis labeled 'Intensity (counts)' and x-axis labeled with wavelength in nanometers.
Graph showing Raman spectral data with intensity counts on the y-axis and Raman shift in cm^-1 on the x-axis. The main spectrum features a peak labeled Cr^3+ PL, and an inset magnifies a section from approximately 4600 to 5500 cm^-1, with a peak labeled Ir^4+ electronic Raman.
A graph with peaks showing intensity counts versus wavelength in nanometers, with labeled peaks at specific wavelengths including 276.18 nm, 287.63 nm, 294.48 nm, 404.06 nm, 417.77 nm, 575.46 nm, and 589.22 nm.