Spectra, Maps, and Forensics

Klar Test and Measurement Services

Specializing in UV through IR Spectroscopic Mapping and Analysis

Klar offers measurement services to provide clients with photoluminescence (PL) and Raman maps of their samples. Klar will deliver maps, data sets, and peak fits for samples ranging from micron-to-centimeter sizes. Klar is presently offering deep UV, UV, visible, and near IR spectral maps (266 - 1700 nm).

Klar’s newest addition to their measurement service is a liquid nitrogen stage enabling 80K-400K with any of its PL and Raman kits.

Klar Scientific’s services enable the discovery of defects, dislocations, compositional and elemental nonuniformities, and interlayer interactions within multilayer structures.

A high-resolution spectral map contains up to 10 million sample points. We will work with you to interpret the data and solve your materials problems. We can also obtain SEM and TEM maps to provide an integrated view of a complex material system’s defects and processing-induced damage.

Fast Turnaround

Detailed Maps and Summary

Data Files Available, Upon Request

PL Map of a 1300 nm LED Array

Colorized electron microscopy image of a microchip with different energy and intensity distributions, featuring a grid-like pattern of squares and a black irregular shape in the lower left corner.

Intensity

Energy of the main emission peak.

    • Semiconductors

    • Heterosctructures

    • Micro-LED arrays

    • High-power circuits

    • Perovskites

    • LEDs and laser diodes

    • Many More

    • Field sizes to 100 mm x 100 mm

    • Resolution <0.6 um

    • Variation sensitivity, 5 men/um

    • Millions of samples

    • Scan-rescan mode (PL/Raman)

    • Interchangeable wavelengths

    • Bandgap uniformity

    • Defects & defect density

    • Interlayer interactions

    • Elemental composition

    • Process Variations

    • Device Features