
Spectra, Maps, and Forensics
Klar Test and Measurement Services
Specializing in UV through IR Spectroscopic Mapping and Analysis
Klar offers measurement services to provide clients with photoluminescence (PL) and Raman maps of their samples. Klar will deliver maps, data sets, and peak fits for samples ranging from micron-to-centimeter sizes. Klar is presently offering deep UV, UV, visible, and near IR spectral maps (266 - 1700 nm).
Klar’s newest addition to their measurement service is a liquid nitrogen stage enabling 80K-400K with any of its PL and Raman kits.
Klar Scientific’s services enable the discovery of defects, dislocations, compositional and elemental nonuniformities, and interlayer interactions within multilayer structures.
A high-resolution spectral map contains up to 10 million sample points. We will work with you to interpret the data and solve your materials problems. We can also obtain SEM and TEM maps to provide an integrated view of a complex material system’s defects and processing-induced damage.
Fast Turnaround
Detailed Maps and Summary
Data Files Available, Upon Request
PL Map of a 1300 nm LED Array
Intensity
Energy of the main emission peak.
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Semiconductors
Heterosctructures
Micro-LED arrays
High-power circuits
Perovskites
LEDs and laser diodes
Many More
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Field sizes to 100 mm x 100 mm
Resolution <0.6 um
Variation sensitivity, 5 men/um
Millions of samples
Scan-rescan mode (PL/Raman)
Interchangeable wavelengths
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Bandgap uniformity
Defects & defect density
Interlayer interactions
Elemental composition
Process Variations
Device Features