Photoluminescence (PL) spectroscopy that is upgradeable to meet your needs.

Laboratory laser system with main unit labeled Klar Scientific, control box, and portable case with various electronic components.

Mini Pro Microscope

The Klar Mini Pro Microscope is a compact, affordable instrument designed for scientists who need spectral information with high spatial resolution.

This system is ideal for shared measurement labs, where multiple users may each require a different excitation wavelength for their material. Wavelength changeover takes under five minutes.

The Klar Mini Pro Microscope performs scanning up to 25 mm x 25 mm and uses autofocus to capture precise spectra from a two-dimensional sample region. Features include targeted re-scanning of interesting regions, and multifunctional scanning using PL and Raman kits to scan and rescan an area.

Klar’s patented autofocus technology keeps the laser spot focused on the sample, even if the surface is rough, tilted, or bowed.

The instrument ships with a user-friendly operating system, a GPU computer, and GPU-based fitting software.

A Mini Pro Microscope system with a 532 nm kit is priced under $110,000.

    • This system is ideal for shared measurement labs

    • Light excitation 266 to 975 nm

    • PL spectral range 266 to 2500 nm

    • XYZ Scanning

    • Submicron in-plane resolution

    • Millions of spectra can be collected

    • GPU accelerated fitting and analysis software

    • Compact footprint (1 sq. ft.)

    • Enclosure insulates microscope from temperature variations, dust, and light

    • Integrated laser safety system

    • Low temperature option

    • Raman options available

    • Everything you need to start taking data

    • Defect identification in light-emitting diodes and lasers

    • PL mapping of wide-band gap semiconductors

    • Luminescence of 2D materials

    • Compositional analysis of semiconductor alloys

    • Failure analysis and quality control

  • The Mini Pro’s universal optical design allows the owner to expand capabilities with user-replaceable wavelength kits.

    • Spectroscopy from the near-IR to the deep-UV (1700-266nm)

    • Change kits in less than 5 minutes

    • Custom kits available

    • Photoluminescence

    • Raman

    • XYZ Scanning

    • Electroluminescence

    • Low Temperature

Prices listed are for US markets and may vary (outside the US). Contact us for a quote.

Defects and Dislocation Densities in InP Wafers

Indium Phosphide wafers are frequently used as substrates for the growth of infrared laser and LED heterostructures. Wafers are commercially available and may easily be obtained in large quantity for production. Defects in substrates are generally specified as a dislocation density, but the inhomogeneity of their distribution and the range of sizes is not known from one wafer to the next. When growing a new device on such a wafer, it is imperative to understand how the substrate defects affect the heterojunctions above them that comprise the active layers of the device. At a minimum, the quality of the wafers should be measurable in order to determine whether they are of sufficient quality to be used in the production of reliable devices with near-zero latent defects.

Klar’s spectroscopic mapping system is ideally suited for capturing the variation of the bandgap across a wafer and identifying the size, distribution, and nature of any defects. Read More…

Energy map of a 2mm x 2mm section of a commercial InP wafer using a 635nm laser excitation source. The dotted box on the map shows a region containing one of the larger defects

Energy map of a 2mm x 2mm section of a commercial InP wafer using a 635nm laser excitation source. The dotted box on the map shows a region containing one of the larger defects.